ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,141, issued on Sept. 8, was assigned to Raytheon Co. (Tewksbury, Mass.). "Event detection system response controller" was invented by Grego... और पढ़ें
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,142, issued on Sept. 8, was assigned to Kioxia Corp. (Tokyo). "Test substrate, test apparatus, and test method for semiconductor integrated... और पढ़ें
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,143, issued on Sept. 8, was assigned to FormFactor Inc. (Livermore, Calif.). "Probe systems and methods of operating probe systems" was inv... और पढ़ें
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,144, issued on Sept. 8, was assigned to Marvell Israel (M.I.S.L) Ltd. (Yokneam, Israel). "Physical layer parameter compliance in high speed... और पढ़ें
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,145, issued on Sept. 8, was assigned to TECHWIDU Co. LTD. (Suwon-si, South Korea). "Test circuit having separately arranged digital and ana... और पढ़ें
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,146, issued on Sept. 8, was assigned to Skyworks Solutions Inc. (Irvine, Calif.). "Sub-sampled based instrument noise correction for jitter... और पढ़ें
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,147, issued on Sept. 8, was assigned to Winbond Electronics Corp. (Taichung City, Taiwan). "Testing circuit for testing electrical devices ... और पढ़ें
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,148, issued on Sept. 8, was assigned to NVIDIA Corp. (Santa Clara, Calif.). "Low power and area clock monitoring circuit using ring delay a... और पढ़ें
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,149, issued on Sept. 8, was assigned to LG Display Co. Ltd. (Seoul, South Korea). "Display device, panel defect detection circuit and panel... और पढ़ें
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,150, issued on Sept. 8, was assigned to Cadence Design Systems Inc. (San Jose, Calif.). "Loopback test for phase interpolator codes" was in... और पढ़ें